Backscattered Electron (BE) Imaging
a technique that uses high energy electrons that originate from the primary electron beam of the SEM and are elastically reflected by the specimen to create an image of the sample. The probability of backscattering is proportional to atomic number.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Source link
Reprinted, with permission, from ASTM E1732-24e1 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org