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Charging

negative charge accumulation on either a nonconductive sample or a sample that is not properly grounded.
Discussion—This effect can interfere with image formation and X-ray analysis because of beam deflection. It can usually be eliminated by the application of a conductive coating or by the use of a low vacuum system.

Committee

Trace Materials

Date Added to Lexicon

01/15/2025

Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)

ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024. Source link

Reprinted, with permission, from ASTM E1732-24e1 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org