System Peaks (Stray Radiation)
peaks that can occur in the X-ray spectrum as a result of interaction of the electron beam or fluorescent radiation with components of the scanning electron microscope itself.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Source link
Reprinted, with permission, from ASTM E1732-24e1 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org