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X-ray Diffraction Pattern or Diffractogram

the characteristic interference pattern obtained when X-rays are diffracted by a crystalline substance; the geometry of the pattern is a function of the repeat distances (lattice dimensions) of the periodic array of atoms in the crystals; the intensities of the diffracted beams give information about the atomic arrangement, and unit-cell dimensions.

Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024. Source link
Reprinted, with permission, from ASTM E1732-24e1 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org