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Nanophysics

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Nanoscale Property Measurements by Atomic Force Microscopy

Ongoing
Over the past several decades, Atomic Force Microscopy (AFM) has advanced from a technique used primarily for surface topography imaging to one capable of characterizing a range of chemical, mechanical, electrical, and magnetic material properties with nanometer resolution. Such characterizations

Publications

Materials Discovery in Combinatorial and High-throughput Synthesis and Processing: A New Frontier for SPM

Author(s)
Boris Slautin, Yungtao Liu, Yu Liu, Reece Emery, Seungbum Hong, Astita Dubey, Vladimir Shvartsman, Doru Lupascu, Sheryl Sanchez, Mahshid Ahmadi, Yunseok Kim, Evgheni Strelcov, Keith Brown, Philip Rack, Sergei Kalinin
For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often

Nagaoka ferromagnetism in 3 × 3 arrays and beyond

Author(s)
Yan Li, Keyi Liu, Garnett Bryant
Nagaoka ferromagnetism (NF) is a long-predicted example of itinerant ferromagnetism (IF) in the Hubbard model that has been studied theoretically for many years

Tools and Instruments