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Physical Measurement Laboratory

Nanoscale Device Characterization Division

News and Updates

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NIST Releases New Standard for Semiconductor Industry

October 12, 2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of semiconductor

Simulation Program Predicts Resistivity in Nanodevices

January 17, 2006

As nanoscale circuits continue to shrink, electrical resistivity increases in the wiring and limits the maximum circuit speed. A new simulation program

NIST Finds Rough Spot in Surface Measurement

July 13, 2005

For makers of computers, disk drives and other sophisticated technologies, a guiding principle is the smoother the surfaces of chips and other components, the

Reference Materials Planned for Semiconductor Industry

June 30, 2005

Companies and research organizations are invited to collaborate with the National Institute of Standards and Technology (NIST) and SEMATECH in the development

Shadow Technique Improves Measurement of Micro Holes

June 2, 2005

Sometimes seeing a shadow can be as good or better than seeing the real thing. A new measurement method developed by researchers working at the National

Experiments Prove Existence of Atomic Chain 'Anchors'

February 3, 2005

Atoms at the ends of self-assembled atomic chains act like anchors with lower energy levels than the "links" in the chain, according to new measurements by

Gaithersburg Man Honored for Distinguished Science Writing

November 30, 2000

Neil M. Zimmerman, has received the 2000 Edward Uhler Condon Award from the National Institute of Standards and Technology, an agency of the Commerce Department

Breakthroughs in Thin-Film Magnetic Devices Earn NIST Stratton Award for Robert D. McMichael

November 30, 2000

The National Institute of Standards and Technology, an agency of the Commerce Department's Technology Administration, has presented its 2000 Samuel Wesley

New Measurement Capabilities to Support Next Generation of Microchips

June 24, 1997

The Commerce Department's National Institute of Standards and Technology, the Energy Department's Sandia National Laboratories and the private sector's SEMATECH

A Blink Of Technology: Femtosecond Chemistry Redefining Molecular Interactions

March 21, 1994

PITTSBURGH—Using ultrafast optics and lasers, physicists and chemists are opening a portal through which they can view the subtlest and quickest changes in

Physicists Use Laser Light to Focus Atoms on Surfaces

November 4, 1993

Physicists at the National Institute of Standards and Technology have successfully demonstrated a rapid new process for fabricating infinitesimally small

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