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The Office of Weights and Measures (OWM) invites you to celebrate World Metrology Day (20 May 2025) marking the sesquicentennial, or 150th anniversary, of the Meter Convention. NIST and OWM will join the metrology community during the 3-day Symposium and Conference highlighting 150 years of metrology and the unique international collaboration under the Meter Convention. The BIPM 150th Poster Exhibition, is a central feature of the conference, consisting of nearly 400 posters from the international metrology community to show the state-of-the-art in nine areas of metrology that were highlighted in the CIPM Strategy 2030+.
NIST OWM’s Elizabeth Benham and Katrice Lippa have been recognized as one of nine “stand-out” scientific posters selected by the International Committee for Weights and Measures (CIPM). Representing the 9th category of “New Opportunities for Metrology,” Elizabeth Benham will share a brief summary of their poster titled Building the Next Generation of Metrologists: Opportunities to Improve SI Education and Scientific Literacy at 150 Years and Beyond with nine other authors during the conference on Wednesday, 21 May 2025 at the Palais des Congrès, Versailles, France.
Explore the full symposium and conference agenda and speaker list for the 20–22 May 2025 celebrations here. The entire digital poster collection and audio summaries are displayed on the anniversary website. Watch the video message from Dr. Martin Milton, BIPM Director.