NISURF-II, An Upgraded Surface Measuring Facility

Published

September 1, 2001

Author(s)

S Z. Zahwi, M F. Koura, Thomas Brian Renegar, A M. Mekawi

Abstract

During 1982-1985, a cooperative project was made between the National Bureau of Standards (NBS) at that time (now National Institute of Standards and Technology (NIST - USA)) and the National Institute for Standards (NIS - Egypt) to establish a computerized surface measuring system that could be used to calibrate roughness specimens for the service of the industrial sector in Egypt. The system was successfully established and was named NISURF-I. The system consisted of a stylus instrument, interfaced to a microcomputer running in the HP BASIC environment, which controlled a digital voltmeter data acquisition unit through a general purpose interface bus (GPIB). This system served the industrial applications till 1999. In 1999 it was decided to upgrade the old system using newer technologies. The system upgrade has been supported by a second cooperative program between NIST and NIS that started in 1999.

Conference Dates

September 24-27, 2001

Conference Location

Cairo, 1, EG

Conference Title

International Symposium on Metrology and Quality Control

Pub Type

Conferences

Keywords

calibration, roughness, software, stylus instrument

Citation

Zahwi, S. , Koura, M. , Renegar, T. and Mekawi, A. (2001), NISURF-II, An Upgraded Surface Measuring Facility, International Symposium on Metrology and Quality Control, Cairo, 1, EG (Accessed May 12, 2025)