Wahlstrand, J.
and Heilweil, E.
(2018),
Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation, Optics Express, [online], https://doi.org/10.1364/OE.26.029848
(Accessed May 8, 2025)
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Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation
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Author(s)
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Abstract
We perform contactless mobility measurements in ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump, THz probe experiment. By using two-photon excitation, one excites the entire sample thickness to produce measurable signals at 1013 carriers/cm3 or higher densities. For ZnTe and GaSe samples, the mobility measured using two-photon excitation is higher than that measured with one-photon excitation.Citation
Optics Express
Volume
26
Issue
23
Pub Type
Journals
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Keywords
bulk semiconductors, mobility, terahertz, two-photon excitation
Citation
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Created October 30, 2018, Updated October 12, 2021