Evaluation of C60 Secondary Ion Mass Spectrometry for the Chemical Analysis and Imaging of Fingerprints

Published

January 22, 2013

Author(s)

Edward R. Sisco, Leonard Demovanville, John G. Gillen

Abstract

The feasibility of using C60 Cluster Primary Ion Bombardment Secondary Ion Mass Spectrometry (C60 SIMS) for the analysis of the chemical composition of fingerprints is evaluated. It was found that C60 SIMS could be used to detect and image the spatial localization of a number of sebaceous and eccrine components in fingerprints. These analyses were also found to not be hindered by the use of common latent print powder development techniques. Finally, the ability to monitor the depth distribution of fingerprint constituents was found to be possible – a capability which has not been shown using other chemical imaging techniques. This paper illustrates a number of strengths and potential weaknesses of C60 SIMS as an additional or complimentary technique for the chemical analysis of fingerprints.

Citation

Forensic Science International

Pub Type

Journals

Keywords

chemical analysis, latent fingerprints, secondary ion mass spectrometry

Citation

Sisco, E. , Demovanville, L. and Gillen, J. (2013), Evaluation of C60 Secondary Ion Mass Spectrometry for the Chemical Analysis and Imaging of Fingerprints, Forensic Science International (Accessed May 11, 2025)