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Metrology

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Displaying 26 - 50 of 5207

Uniform Laws and Regulations in the Areas of Legal Metrology and Fuel Quality

January 10, 2025
Author(s)
John McGuire, David Sefcik, Loren Minnich, Isabel Baucom, Katrice Lippa
This 2025 edition includes amendments made through the Committee on Laws and Regulations of the NCWM with technical guidance from the Office of Weights and Measures (OWM) of the NIST and input from weights and measures officials and industry

Methods to evaluate 3D lidars used for automated driving

January 1, 2025
Author(s)
Prem Rachakonda, Abhilash Mane, Craig I. Schlenoff, Kamel S. Saidi
Evaluating perception sensor systems for on-road autonomous vehicles is still fraught with ambiguity due to the varying and dynamic environmental factors that these vehicles encounter. The critical safety of on-road AV operations is heavily dependent on

CCQM_Retrospectoscope Reference Manual: A detailed reference to the CCQM_Retrospectoscope, a suite of graphical tools for the meta-analysis of measurement results from CCQM studies

December 12, 2024
Author(s)
David L. Duewer, Christina Cecelski, Michael Nelson
This document is a detailed reference manual for the 1-September-2024 version of the CCQM_Retrospectoscope system. The CCQM_Retrospectoscope combines a nominally complete database of results from Consultative Committee for the Amount of Substance

Optical Characterization of Parasitic Motion in a Long-Stroke Shaker

December 2, 2024
Author(s)
Jared Strait, Richard A. Allen
We present an optical scheme to simultaneously characterize the cross-axis and rotational parasitic motions of a long-stroke shaker. By leveraging the geometric properties of a corner cube retroreflector mounted on the shaker load table, we independently

Characterizing interconnects to 325 GHz

November 20, 2024
Author(s)
Nicholas Jungwirth, Bryan Bosworth, Meagan Papac, Aaron Hagerstrom, Eric Marksz, Jerome Cheron, Angela Stelson, Florian Bergmann, Ari Feldman, Dylan Williams, Christian Long, Nathan Orloff
We developed an interconnect characterization procedure that first embeds the interconnect into the error boxes of a multiline thru-reflect-line calibration and subsequently de-embeds the interconnect with a multi-tiered calibration. We experimentally

Measuring social consensus

November 18, 2024
Author(s)
David W. Flater
Many organizations describe their processes as consensus-driven, but there is no consensus on the definition of consensus. Qualitative definitions of consensus prioritize social phenomena like "unity" that are not necessarily measurable. Quantitative

Certification of Standard Reference Material(R) 1641f Mercury in Water

November 14, 2024
Author(s)
Colleen Bryan Sallee, Therese Butler, Jenna Klingsick, John Molloy, James Yen
Standard Reference Material (SRM) 1641f Mercury in Water is intended for the calibration of instruments and techniques used for the determination of mercury in natural waters. It is designed for the preparation of calibration solutions and for use as a

Ultraviolet to Short-Wave Infrared Spectral Reflectance

October 28, 2024
Author(s)
Heather Patrick, Clarence Zarobila
The National Institute of Standards and Technology performs calibrations of spectral reflectance measurements in the ultraviolet (UV) to short-wave infrared (SWIR) spectral regions using the Robotic Optical Scattering Instrument (ROSI) and its associated

Compact Homodyne Extrapolation System (CHEXS)

October 27, 2024
Author(s)
Joshua Gordon, Benjamin Moser
We present on a novel gain extrapolation antenna range, the Compact Homodyne Extrapolation System (CHEXS), that can achieve absolute antenna gain measurements with uncertainties of 0.1 dB or better with as few at 10 data points and is significantly more

Speed of Sound for Understanding Metals in Extreme Environments

October 7, 2024
Author(s)
Elizabeth Rasmussen, Boris Wilthan
Knowing material behavior is crucial to successful design, especially given the growing number of next-generation energy, defense, and manufacturing systems operating in extreme environments. Specific applications for materials in extreme environments

Terahertz On-wafer mTRL Calibration Kits For Microelectronics Characterization

October 7, 2024
Author(s)
Jerome Cheron, Robert Jones, Bryan Bosworth, Jeffrey Jargon, Benjamin Jamroz, Ari Feldman
We report accurate small-signal measurements of heterojunction-bipolar-transistors (HBTs) that are characterized with two on-wafer multiline thru-reflect-line (mTRL) calibration kits. The first calibration kit is designed with thin-film microstrip

A digital four-arm bridge for the comparison of resistance with capacitance

September 11, 2024
Author(s)
Yicheng Wang, Stephan Schlamminger
A digital four-arm bridge for the comparison of resistance with capacitance has been designed and demonstrated. The digital bridge mimics the classical quad bridge in the digital domain with three balances: the source balance, the detector balance, as well

Complex Precipitation Behavior in a Co-free High Entropy Alloy during Aging

September 11, 2024
Author(s)
Matthew Luebbe, Fan Zhang, Jonathan Poplawsky, Jiaqi Duan, Haiming Wen
High entropy alloys (HEAs) demonstrate high strength, thermal stability, and irradiation resistance, making them desirable for applications in nuclear reactors and other harsh environments. Many existing HEAs contain cobalt (Co), which makes them

On Digital Signal Processing of Time Series for Spectrum Estimation

September 11, 2024
Author(s)
Dazhen Gu, Jake Rezac, Xifeng Lu, Dan Kuester
We present a study of power spectral density (PSD) estimation from data sampled in the time domain. This work was motivated by our recent development of digital radiometry, where radiation spectra were obtained by processing the digitally sampled signal

Traceable RF Power Metering Procedures With Thermoelectric Sensors

September 4, 2024
Author(s)
Zenn Roberts, Aaron Hagerstrom, Cole Gray, Angela Stelson, Vincent Neylon, Christian Long
The National Institute of Standards and Technology (NIST) maintains the United State's primary standards for traceable RF and mm-wave power measurements. These measurements require special sensors that carry no active electronics, and that have operating