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Dianne L. Poster, C Cameron Miller, Yaw S. Obeng, John J. Kasianowicz, Michael T. Postek, Norman Horn, Troy Cowan, Richard Martinello
The development of an international, precompetitive, collaborative, ultraviolet (UV) research consortium is discussed as an opportunity to lay the groundwork for a new UV commercial industry and the supply chain to support this industry. History has
Martin Serrano, Edward Griffor, David A. Wollman, Michael Dunaway, Martin Burns, Sokwoo Rhee, Chris Greer
This publication presents research findings and scientific work that advance the development and progression of smart city and community measurement methodology. The term 'smart,' as used in the phrase 'smart cities,' is defined here as the efficient use
Simon Taylor, Bjorn Johansson, Sumin Jeon, Loo Hay Lee, Peter Lendermann, Guodong Shao
Digital Twins have recently emerged as a major new area of innovation. Digital Twins are often found at the core of "smart" solutions that have also emerged as major areas of innovation. Modeling and Simulation (M&S) approaches create a model of a real
This white paper highlights a recent mapping effort between the North American Electric Reliability Corporation (NERC) Critical Infrastructure Protection (CIP) standards and the NIST Cybersecurity Framework. Mappings of these two frameworks have been
Even the best written specifications can be complicated documents to read and understand. Normative prose is often supported by tables and diagrams intended to clarify the specification. What happens when a tool developer interprets those clarifying
Dianne L. Poster, C Cameron Miller, Richard Martinello, Norman Horn, Michael T. Postek, Troy Cowan, Yaw S. Obeng, John J. Kasianowicz
The National Institute of Standards and Technology (NIST) hosted an international workshop on ultraviolet-C (UV-C) disinfection technologies on January 14 – 15, 2020 in Gaithersburg, Maryland in collaboration with the International Ultraviolet Association
Nenad Ivezic, Boonserm Kulvatunyou, Elena Jelisic, Hakju Oh, Simon P. Frechette, Vijay Srinivasan
It is generally observed in inter-organizational communication that present-day data exchange standards are too costly and too complex to develop and use. These problems in data exchange are felt keenly by manufacturing industry with its vast supply chains
Kamal Choudhary, Kevin Garrity, Andrew C. Reid, Brian DeCost, Adam Biacchi, Angela R. Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe
The Joint Automated Repository for Various Integrated Simulations (JARVIS) is an integrated infrastructure to accelerate materials discovery and design using density functional theory (DFT), classical force-fields (FF), and machine learning (ML) techniques
Digital twin has the potential to be an important technology for achieving smart manufacturing. However, there remains a lot of confusion about the concept and how it can be implemented in real manufacturing systems, especially among small-to-medium
Cuong T. Nguyen, Avi M. Gopstein, Danielle S. Byrnett, Kerry Worthington, Christopher Villarreal
From September to November 2018, the National Institute of Standards and Technology (NIST) partnered with the National Association of Regulatory Utility Commissioners (NARUC) to hold a series of roundtable meetings to support the revision of its Framework