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Search Publications by: Albert Henins (Ctr)

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Displaying 76 - 100 of 146

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

X-ray measurements at high-power lasers

May 1, 2009
Author(s)
Lawrence T. Hudson, C.I Szabo, Paul Indelicato, G.E. Gumberidze, G Holland, John F. Seely, Albert Henins, M Audebert, S. Bastiani-Ceccotti, E. Tabakhoff, E. Brambrink
Conversion efficiencies of laser light into K x-ray radiation are used to characterize laser-solid interactions e.g. in measurements with back-lighter targets in Inertial Confinement Fusion research or in ultra short x-ray science where ultra short laser

Accurate Determination of High Energy Gamma-Ray Standards

October 16, 2008
Author(s)
Ernest G. Kessler Jr., Maynard S. Dewey, R Deslattes, Albert Henins, H G. Borner, M Jentschel, H Lehmann
The extension of accurate crystal diffraction spectroscopy to the 2 to 6 MeV region is described. Gamma-ray standards with a relative uncertainty of (2 to 5)x10 -7 are obtained by measuring the small diffraction angles (a few tenths of a degree) through