Publications

Displaying 26 - 50 of 378

Calibrations and Checks of the Binding-Energy Scales of X-ray Photoelectron Spectrometers

January 17, 2019

Author(s)

Cedric J. Powell

A recent paper in this journal [B. V. Crist, J. Electron Spectrosc. Relat. Phenom. (in press)] describes calibration problems with core-electron binding energies measured by X-ray photoelectron spectrometers. The present article corrects and extends

Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm

December 27, 2018

Author(s)

Cedric J. Powell, H Shinotsuka, Shigeo Tanuma, David R. Penn

We have calculated inelastic mean free paths (IMFPs) for 42 inorganic compounds (AgBr, AgCl, AgI, Al2O3, AlAs, AlN, AlSb, cubic BN, hexagonal BN, CdS, CdSe, CdTe, GaAs, GaN, GaP, GaSb, GaSe, InAs, InP, InSb, KBr, KCl, MgF2, MgO, NaCl, NbC0.712, NbC0.844

NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA), Version 2.1.1

September 18, 2018

Author(s)

Cedric J. Powell

The purpose of the NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) is to facilitate quantitative interpretation of Auger-electron and X-ray photoelectron spectra (AES/XPS) for surface analysis and to improve the accuracy

Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

January 25, 2018

Author(s)

Cedric J. Powell, Wolfgang Werner, Henryk Kalbe, Alexander Shard, David G. Castner

We assessed two approaches for determining shell thicknesses of core-shell nanoparticles (NPs) by X-ray photoelectron spectroscopy. These assessments were based on simulations of photoelectron peak intensities for Au-core/C-shell, C-core/Au-shell, Cu-core

NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA), SRD 100, Version 2.1

December 21, 2017

Author(s)

Wolfgang Werner, Werner Smekal, Cedric J. Powell

The objective of the NIST database for Simulation of Electron Spectra for Surface Analysis (SESSA) is to facilitate quantitative interpretation of Auger-electron and X-ray photoelectron spectra (AES/XPS). The database contains physical data required to

Quantitative Analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy Part II: Systematic uncertainties and absolute quantification

December 1, 2017

Author(s)

Nadir S. Faradzhev, Shannon B. Hill, Cedric J. Powell

We discuss analyses of trace levels of surface contamination using X-ray photoelectron spectroscopy (XPS). The problem of quantifying common sources of statistical and systematic uncertainties for these measurements is formulated in terms of the needs of

Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy, Part I: statistical uncertainty near the detection limit

December 1, 2017

Author(s)

Shannon B. Hill, Nadir S. Faradzhev, Cedric J. Powell

We discuss the problem of quantifying common sources of statistical uncertainties for analyses of trace levels of surface contamination using X-ray photoelectron spectroscopy. We examine the propagation of error for peak-area measurements using common

Effective attenuation lengths for quantitative surface analysis by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

April 26, 2017

Author(s)

Cedric J. Powell, Aleksander Jablonski

The effective attenuation length (EAL) is normally used in place of the inelastic mean free path (IMFP) to account for elastic-scattering effects when describing the attenuation of Auger electrons and photoelectrons from a planar substrate by an overlayer

Simulated photoelectron intensities at the aqueous solution-air interface for flat and cylindrical (microjet) geometries

March 17, 2017

Author(s)

Cedric J. Powell, Giorgia Olivieri, Krista Parry, D. J. Tobias, Matthew Brown

Ion spatial distributions at the water-air/vacuum interface are accessible by energy-dependent X-ray photoelectron spectroscopy (XPS). Here we quantify the difference between a flat surface and a cylindrical shaped microjet on the energy-dependent

Evaluation of Two Methods for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

September 27, 2016

Author(s)

Cedric J. Powell, Wolfgang Werner, Alexander Shard, David G. Castner

We evaluated two methods for determining shell thicknesses of core-shell nanoparticles (NPs) by X-ray photoelectron spectroscopy (XPS). One of these methods had been developed for determining thicknesses of films on a planar substrate while the other was

NIST Electron Elastic-Scattering Cross-Section Database, Version 4.0

September 14, 2016

Author(s)

Cedric J. Powell, Aleksander Jablonski, Francesc Salvat, Angela Y. Lee

Version 4.0 of this database (SRD 64) provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections for elements with atomic numbers from 1 to 96 and for electron

Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV

August 30, 2016

Author(s)

Cedric J. Powell, B Da, Shigeo Tanuma, H. Yoshikawa, H Shinotsuka, David R. Penn

We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energies from 50 eV to 30 keV with the relativistic full Penn algorithm (FPA) that has been used for previous IMFP and

Inelastic Mean Free Paths, Mean Escape Depths, Information Depths, and Effective Attenuation Lengths for Hard X-ray Photoelectron Spectroscopy

June 1, 2016

Author(s)

Cedric J. Powell, Shigeo Tanuma

An overview is given of recent work on the determination of inelastic mean free paths, mean escape depths, information depths, and effective attenuation lengths for applications in hard X-ray photoelectron spectroscopy (HAXPES). Sources of data are

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