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Search Publications by: Jack A. Stone Jr. (Assoc)

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Displaying 76 - 100 of 128

Measuring Internal Geometry of Fiber Ferrules

May 1, 2005
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
The focus of this paper is on the metrology of microstructures. Traditional Coordinate Measuring Machines (CMM) are limited to measuring holes of 300 m diameter. Smaller features and holes require thinner styli & novel probing technologies that can

Micro-Feature Metrology

May 1, 2005
Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
This presentation focuses on three aspects of micro-feature metrology novel applications that drive research and commercialization, capabilities and limitations of existing sensors and techniques, and finally a summary of recent research including ongoing

Refractometry Using a Helium Standard

April 1, 2005
Author(s)
Jack A. Stone Jr., Alois Stejskal
The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore, the low refractive index of helium puts minimal demands on the pressure and temperature

Refractometry Using a Helium Standard

July 1, 2004
Author(s)
Jack A. Stone Jr., Alois Stejskal
The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore, the low refractive index of helium puts minimal demands on the pressure and temperature

Performance Analysis of Next-Generation LADAR for Manufacturing, Construction, and Mobility

May 6, 2004
Author(s)
William C. Stone, Maris Juberts, Nicholas Dagalakis, Jack A. Stone Jr., Jason J. Gorman
The NIST Construction Metrology and Automation Group (CMAG), in cooperation with the NIST Intelligent Systems Division (ISD), is developing performance metrics and researching issues related to the design and development of a Next-Generation LADAR (laser

Uncertainties in Small-Angle Measurement Systems Used to Calibrate Angle Artifacts

May 1, 2004
Author(s)
Jack A. Stone Jr., M Amer, Bryon S. Faust, Jay H. Zimmerman
We have studied a number of effects that can give rise to errors in small-angle measurement systems when they are used to calibrate artifacts such as optical polygons. Of these sources of uncertainty, the most difficult to quantify are errors associated

Angle Metrology Using AAMACS and Two Small-Angle Measurement Systems

November 28, 2003
Author(s)
Jack A. Stone Jr., M Amer, Bryon S. Faust, Jay H. Zimmerman
The highest accuracy method for angle measurement employed at NIST(National Institute of Standards and Technology) makes use of an automated stack of three indexing tables-- our Advanced Automated Master Angle Calibration System (AAMACS)-- in conjunction

Wavelength-Tracking Capabilities of a Fabry-Perot Cavity

November 20, 2003
Author(s)
Jack A. Stone Jr., Alois Stejskal
We have characterized the accuracy of atmospheric wavelength tracking based on a laser servolocked to a simple Fabry-Peron cavity. The motivations are (1) to explore a method for air refractive index measurement and (2) to determine the stability and

The Advanced Angle Metrology System at NIST

November 1, 2003
Author(s)
Jack A. Stone Jr.
At the National Institute of Standards and Technology, our best capability for angle measurement is our Advanced Automated Master Angle Calibration System (AAMACS). This instrument is based on a triple-stack of indexing tables, used in conjunction with

Index of Refraction of Air

February 16, 2001
Author(s)
Jack A. Stone Jr., Jay H. Zimmerman
These Web pages are intended primarily as a computational tool that can be used to calculate the refractive index of air for a given wavelength of light and given atmospheric conditions (air temperature, pressure, and humidity). The calculations are

Real-Time Displacement Measurements With a Fabry-Perot Cavity and a Diode Laser

January 1, 2000
Author(s)
Lowell P. Howard, Jack A. Stone Jr.
We present the basic operating principles of a traceable measurement system for use with scanned probe microscopes and nanometer-resolution displacement sensors. Our method is based upon a tunable external-cavity diode laser system which is Pound-Drever