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Search Publications by: Joseph Woicik (Fed)

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Displaying 26 - 50 of 218

Effects of Solution pH and Surface Chemistry on the Post-Deposition Growth of Chemical Bath Deposited PbSe Nanocrystalline Films

October 12, 2021
Author(s)
Shaibai K. Sarkar, Shifi Kababya, Shimon Vega, Hagal Cohen, Joseph Woicik, A I. Frenkel, Gary Hodes
Chemical bath deposited PbSe films were subjected to post-deposition treatment with aqueous (typically 0.25 - 0.5 M) KOH. For films deposited using a citrate complex, this treatment resulted in dissolution of surface lead oxides (seen from XPS and EXAFS

Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001

October 12, 2021
Author(s)
F S. Aguirre-Tostado, A Herrera-Gomez, Joseph Woicik, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Pianetta, C S. Hellberg
The driving force of the semiconductor industry to integrate thin transition-metal oxides with Si transistor technology has led to the development of SrTiO3 thin-film growth on Si(001). As SrTiO3 represents a large class of oxides with the perovskite

Layer Perfection in Ultrathin, MOVPE-Grown InAs Layers Buried in GaAs(001) Studied by X-Ray Standing Wave and Photoluminescence Spectroscopy

October 12, 2021
Author(s)
J A. Gupta, Joseph Woicik, S P. Watkins, D A. Harrison, E D. Crozier, B A. Karlin
Using the In-L fluorescence produced by normal-incidence X-ray standing waves, we have measured the layer perfection and positions for ML = 1 and 1/2 (where ML = # of mono layers) InAs quantum wells buried in GaAs(001). Growth temperature effects were

NiO: A Charge Transfer or Mott-Hubbard Insulator

October 12, 2021
Author(s)
T M. Schuler, D L. Ederer, S Itza-Ortiz, G T. Woods, T A. Callcott, Joseph Woicik
Using site-specific soft x-ray emission and absoroption spectroscopy in conjunction with site-specific x-ray photoelectron spectroscopy, we measure the magnitude of the insulating band gap of NiO to be approximately 2.0 eV, comparable to that predicted by

Pulsed Laser Deposition and Characterization of Hf Based High-k Dielectric Thin Films

October 12, 2021
Author(s)
M A. Sahiner, Joseph Woicik, P Gao, P McKeown, Mark Croft, M Gartman, B Benapfl
The continuous downward scaling of the complementary metal oxide semiconductor (CMOS) devices has enabled the Si-based semiconductor industry to meet the technological requirements such as high performance and low power consumption. However, the

Stoichiometry and Phase Composition of MOCVD Barium Titanate Films

October 12, 2021
Author(s)
Charles E. Bouldin, Joseph Woicik, Bruce Ravel, Debra Kaiser, Mark D. Vaudin
X-ray absorption fine structure (XAFS), x-ray diffraction (XRD) and x-ray fluorescence (XRF) have been used to study the stoichiometry and phase composition of thin (approximately equal to} 1 micron) films deposited on MgO substrates. Deposition

Surface Morphology Dependent Magnetic Thin Film Growth: Fe on GaN(0001)

October 12, 2021
Author(s)
P Ryan, R A. Rosenberg, D J. Keavney, J W. Freeland, Joseph Woicik
Iron deposition on ordered and disordered GaN (0001) surfaces result in dramatically different magnetic over-layer characteristics. On the ordered surface, nitrogen rapidly desorbs upon Fe deposition and a magnetically disordered film is produced