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Search Publications by: Jan Obrzut (Fed)

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Displaying 76 - 100 of 226

Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity

May 15, 2014
Author(s)
Jan Obrzut, Nathan D. Orloff, Oleg A. Kirillov
A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials

Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals

June 1, 2013
Author(s)
Chukwudi A. Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S. Obeng
In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV daisy

Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis

May 28, 2013
Author(s)
Chukwudi A. Okoro, Yaw S. Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity in

Power Density Rating for Embedded Resistors

July 9, 2012
Author(s)
Jan Obrzut, Jason D. Ferguson, MIchael H. Azarian
The Power Density Ratting (PDR) for Embedded Resistors test method covers procedures for the demonstration of the ability to operate the embedded device safely within nominal tolerance, at rated power, and to withstand the transient voltage waves resulting

Graphene: A New Horizon for Modern Technology

September 15, 2011
Author(s)
Jan Obrzut
Graphene has the potential to improve a long list of daily electronics that are the foundation of the modern computing revolution. In step with research in renewable energy, graphene can and has been used in efficient, flexible solar cells. Crossing the

Springer Handbook of Metrology and Testing, Electrical Properties

August 1, 2011
Author(s)
Jan Obrzut, Bernd Schumacher, Heinz-Gunter Bach, Petra Spitzer
The dielectric properties of materials are used to describe electrical energy storage, dissipation and energy transfer. The most relevant physical processes in dielectric materials from the practical view point are those which result in power loss

Microwave Characterization of Transparent Conducting Films

May 26, 2011
Author(s)
Jan Obrzut, Oleg A. Kirillov
The high frequency conductivity of thin metallic and graphitic nano-films attracts interest due to many potential applications in spin electronics, electromagnetic shielding, flexible antennas, displays, and solar cells. The surface morphology of thin