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Search Publications by: Ya-Shian Li-Baboud (Fed)

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Displaying 101 - 125 of 147

Improving Data Quality in Embedded Sensor Systems for APC

September 28, 2009
Author(s)
Julien M. Amelot, YaShian Li-Baboud
Achieving next-generation factory (NGF) goals has been an industry challenge for APC applications to acquire a sufficient level of data quality to maximize the benefits of automation. For example, it is difficult to get accurate timestamps because sensor

A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis

October 1, 2008
Author(s)
Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, Ya-Shian Li-Baboud, James Moyne
Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the

Assessment of Industry Research Priorities for Intelligent Sensors and Control

October 1, 2008
Author(s)
YaShian Li-Baboud, Julien M. Amelot, Julien Le Guen, Alan Weber, Paul McGuire
Sensor networks and intelligent control have garnered much excitement among researchers in industry, government, and academia. Revolutionary advances have been made in the deployment of sensors and control systems for driving intelligent applications in a

Identity management standards for product life cycle of electronic parts

September 10, 2008
Author(s)
YaShian Li-Baboud, Eric D. Simmon, Yaw S. Obeng
The high profit opportunities, the diffused outsourcing of manufacturing and the structure of distribution networks make the electronics and its components susceptible to counterfeiting. Distinguishing the genuine article from counterfeit is increasingly

Precise Time Synchronization in Semiconductor Manufacturing

October 3, 2007
Author(s)
Vinod Anandarajah, Naveen Kalappa, Julien L. Baboud, Ya-Shian Li-Baboud, James Moyne
In today's fabs, coordination of time-based information throughout the factory and enterprise has become necessary. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as Network Time

Fab-wide Network Time Synchronization - Simulation and Analysis

September 28, 2007
Author(s)
Naveen Kalappa, Vinod Anandarajah, Julien L. Baboud, Ya-Shian Li-Baboud, James Moyne
In today?s fabs, coordination of time-based information throughout the factory and enterprise has become necessary. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as Network Time

Advancing Factory-Wide Data Quality for APC Applications

November 30, 2006
Author(s)
Harvey Wohlwend, Gino Crispieri, Ya-Shian Li-Baboud
Accurate clock synchronization and time stamping plays a significant role in ensuring data quality as the semiconductor industry faces an imminent data explosion with the deployment of Interface A. Standards and Guidelines significantly ease the deployment

Advancing Towards Factory-Wide Data Quality for APC Applications

September 30, 2006
Author(s)
Harvey Wohlwend, Gino Crispieri, Ya-Shian Li-Baboud
Advancing to the next levels of Advanced Process Control (APC) requires the ability to intelligently merge existing and new data sources in order to refine semiconductor manufacturing. To fully exploit the acquired data points for analyses in APC