October 5, 2008
Author(s)
John E. Kitching, Svenja A. Knappe, Vladislav Gerginov, Vishal Shah, Peter D. Schwindt, Brad Lindseth, Elizabeth A. Donley, Ying-ju Wang, Eleanor Hodby, Matt Eardley, Ricardo Jimenez Martinez, William C. Griffith, Andrew Geraci, Jan Preusser, Tara C. Liebisch, Hugh Robinson, Leo Hollberg
We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers