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Search Publications by: Michael H. Kelley (Assoc)

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Displaying 1 - 25 of 114

Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance

October 12, 2021
Author(s)
John Unguris, D. Tulchinsky, Michael H. Kelley, Julie Borchers, Joseph Dura, Charles Majkrzak, S. Y. Hsu, R. Loloee, W. P. Pratt, J. Bass
The magnetic microstructure responsible for the metastable high resistance state of weakly coupled, as-prepared [Co(6nm)/Cu(6nm)] 20 multilayers was analyzed using polarized neutron reflectivity and scanning electron microscopy with polarization analysis

Towards More Effective Spectrum Test

May 16, 2014
Author(s)
Alan D. Skillicorn, Michael H. Kelley, Thomas J. Taylor, Eric Nelson
In response to the Presidential Memorandum on Wireless Innovation and the recommendation of the Presidential Council of Advisors on Science and Technology (PCAST), the federal government has begun the process of organizing a National Advanced Spectrum and

The Electronic Kilogram

May 1, 2001
Author(s)
Michael H. Kelley
The kilogram is the only remaining base unit in the International System of Units (SI) whose definition is based on a single physical artifact rather than on fundamental properties of nature. Effects such as environmental contamination or material loss

Future Voltage Metrology at NIST

January 1, 2001
Author(s)
Yi-hua D. Tang, June E. Sims, Michael H. Kelley
Presently NIST uses a voltage calibration path to maintain the U.S. legal volt and provide for the dissemination of an internationally consistent, accurate, reproducible and traceable voltage standard, tied to the SI units. Potential improvements and

Techniques to Measure Magnetic Domain Structures

September 11, 2000
Author(s)
Robert Celotta, John Unguris, Michael H. Kelley, Daniel T. Pierce
A summary of the current techniques for magnetic domain imaging of materials, including the practical aspects of each technique, the requirements on the sample, the specimen modification allowed and the problems normally encountered. References to more

Magnetic Depth Profiling Co/Cu Multilayers to Investigate Magnetoresistance

May 1, 2000
Author(s)
John Unguris, D Tulchinsky, Michael H. Kelley, Julie A. Borchers, Joseph A. Dura, Charles F. Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass
The magnetic microstructure responsible for the metastable high resistance state of weakly coupled, as-prepared [Co(6nm)/Cu(6nm)] 20 multilayer was analyzed using polarized neutron reflectivity (PNR) and scanning electron microscopy with polarization

Observation of antiparallel magnetic order in weakly coupled Co/Cu multilayers

May 23, 1998
Author(s)
Julie Borchers, Joseph Dura, John Unguris, D Tulchinsky, Michael H. Kelley, Charles Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass
Polarized neutron reflectivity and scanning electron microscopy with polarization analysis are combined to determine the magnetic structure of Co(6 nm)/Cu(6 nm) multilayers. These data resolve a controversy regarding the low-field state of giant

Fabrication and Domain Imaging of Iron Magnetic Nanowire Arrays

May 1, 1998
Author(s)
D Tulchinsky, Michael H. Kelley, Jabez J. McClelland, R Gupta, Robert Celotta
Arrays of magnetic nanowires are fabricated by using a corrugated surface, produced by chromium atoms laser-focused in a one-dimensional standing wave, as a shadow mask for an iron evaporator. The deposited iron forms a periodic array consisting of

Optimizing the NIST Magnetic Imaging Reference Sample

September 1, 1997
Author(s)
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have

Scanning Electron Microscopy with Polarization Analysis (SEMPA)

January 1, 1997
Author(s)
John Unguris, M Scheinfein, Michael H. Kelley, A Gavrin, Robert Celotta, Daniel T. Pierce
Scanning Electron Microscopy with Polarization Analysis (SEMPA) is a technique for the high spatial resolution imaging of magnetic microstructure. It employs a Scanning Electron Microscope (SEM) to create a finely focused electron beam on the surface of a

The NIST Magnetic Imaging Reference Sample

January 1, 1997
Author(s)
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have

Domain Structures in Magnetoresistive Granular Metals

January 1, 1995
Author(s)
A Gavrin, Michael H. Kelley, J Xiao, C Chien, Robert Celotta
We have imaged the magnetic domain structure of several heterogeneous Co xAg 1-x alloys by using scanning electron microscopy with polarization analysis. These images show that extended domain structures exist in both the as-deposited samples and in