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Search Publications by: John D. Gillaspy (Fed)

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Displaying 151 - 175 of 314

Trapped Highly Charged Ion Plasmas

January 1, 2002
Author(s)
E Takacs, John D. Gillaspy
Electron beam Ion Trap (EBIT) devices are reviewed with special attention to applications in highly charged ion plasma research. EBIT properties are presented based on information extracted from a variety of experiments presented in the literature. Topics

Quantum Electrodynamics in the Dark

August 1, 2001
Author(s)
John D. Gillaspy
Perhaps they're just shy, but heavy atoms seem very uncomfortalbe when most of their electrons are stripped off. In order to cover their nakedness as quickly as possible, they aggressively try to steal electrons from any source they encounter. Their

Analysis of Broadband X-Ray Spectra of Highly Charged Krypton From a Microcalorimeter Detector of an Electron-Beam Ion Trap

April 1, 2001
Author(s)
I Kink, J M. Laming, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, N. Madden, D Landis, J. Beeman, E. E. Haller
Spectra of highly charged Kr ions, produced in an EBIT, have been recorded in a broad x-ray energy band (0.3-4 keV) with a microcalorimeter detector. Most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition

Highly Charged Ions

January 1, 2001
Author(s)
John D. Gillaspy
This article reviews some of the fundamental properties of highly charged ions, the methods of producing them (with particular emphasis on table-top devices), and their use as a tool for both basic science and applied technology. Topics discussed include

In Situ Imaging of Highly Charged Ion Irradiated Mica

January 1, 2001
Author(s)
L P. Ratliff, John D. Gillaspy
We have studied the modification of mica surfaces due to the impact of Xe44+ ions by imaging the ion-exposed surfaces with atomic force microscopy in vacuum. By incorporating the microscope into the vacuum chamber where the samples are exposed to the ions