Osborn, W.
, Friedman, L.
and Vaudin, M.
(2017),
Strain Measurement of 3D Structured Nanodevices by EBSD, Microscopy and Microanalysis 2017, St Louis, MO, US
(Accessed May 11, 2025)
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Strain Measurement of 3D Structured Nanodevices by EBSD
Published
Author(s)
, ,
Proceedings Title
Microscopy and Microanalysis 2017
Conference Dates
August 6-10, 2017
Conference Location
St Louis, MO, US
Pub Type
Conferences
Citation
Issues
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Created August 7, 2017, Updated March 7, 2023