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Search Publications by: David G. Seiler (Assoc)

Displaying 76 - 100 of 166

Quantum Conductance Fluctuations in a New Size-Scale Regime

May 5, 1996

Author(s)

Curt A. Richter, David G. Seiler, Joseph G. Pellegrino

Characterization of Two-Dimensional Dopant Profiles: Status and Review

February 1, 1996

Author(s)

Alain C. Diebold, M. Kump, Joseph Kopanski, David G. Seiler

Semiconductor Characterization: Present Status and Future Needs

January 3, 1996

Author(s)

W M. Bullis, David G. Seiler, A C. Diebold

Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors

December 31, 1995

Author(s)

Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G. Seiler, W M. Bullis

Characterization of Two-Dimensional Dopant Profiles: Status and Review

December 31, 1995

Author(s)

Alain C. Diebold, M. Kump, Joseph Kopanski, David G. Seiler

Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses

December 31, 1995

Author(s)

Jin S. Kim, David G. Seiler, R. A. Lancaster, M. B. Reine

Mesoscopic Conductance Fluctuations in Large Devices

December 31, 1995

Author(s)

Curt A. Richter, David G. Seiler, Joseph G. Pellegrino

Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices

December 31, 1995

Author(s)

Curt A. Richter, David G. Seiler, Joseph G. Pellegrino, W. F. Tseng, W. R. Thurber

Optical Characterization of Materials and Devices for the Semiconductor Industry: Trends and Needs

December 31, 1995

Author(s)

S. Perkowitz, David G. Seiler, W M. Bullis

Semiconductor Measurement Technology: Survey of Optical Characterization Methods for Materials, Processing, and Manufacturing in the Semiconductor Industry

December 1, 1995

Author(s)

W M. Bullis, S. Perkowitz, David G. Seiler

International Workshop on Semiconductor Characterization: Present Status and Future Needs

November 1, 1995

Author(s)

David G. Seiler, Thomas J. Shaffner

Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements

September 1, 1995

Author(s)

Jin S. Kim, David G. Seiler, Luigi Colombo, M. C. Chen

Characterization of LPE HgCdTe Films by Magnetoresistance

December 31, 1994

Author(s)

Jin S. Kim, David G. Seiler, Luigi Colombo