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Search Publications by: David G. Seiler (Assoc)

Displaying 101 - 125 of 166

Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts

December 31, 1994

Author(s)

Alain C. Diebold, M. Kump, Joseph Kopanski, David G. Seiler

Electrical Characterization of Liquid-Phase Epitaxially Grown Single-Crystal Films of Mercury Cadmium Telluride by Variable-Magnetic-Field Hall Measurements

December 31, 1994

Author(s)

Jin S. Kim, David G. Seiler, Luigi Colombo, M. C. Chen

Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses

December 31, 1994

Author(s)

Jin S. Kim, David G. Seiler, R. A. Lancaster, M. B. Reine

Magneto-Transport Properties of HgCdTe, EMIS Data Reviews

December 31, 1994

Author(s)

J R. Lowney, Jin S. Kim, David G. Seiler

Optical Properties of Semiconductors

December 31, 1994

Author(s)

Paul M. Amirtharaj, David G. Seiler

Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon

December 1, 1994

Author(s)

Joseph Kopanski, Jay F. Marchiando, J R. Lowney, David G. Seiler

Optical Characterization in Microelectronics Manufacturing

September 1, 1994

Author(s)

S. Perkowitz, David G. Seiler, William Duncan

Optical Characterization in Microelectronics Manufacturing

September 1, 1994

Author(s)

S. Perkowitz, David G. Seiler

Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer

May 30, 1994

Author(s)

J R. Lowney, W. R. Thurber, David G. Seiler

Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites

April 1, 1994

Author(s)

David G. Seiler, J R. Lowney, W. R. Thurber, Joseph Kopanski, George G. Harman

Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs

December 31, 1993

Author(s)

David G. Seiler, Santos D. Mayo, J R. Lowney

RII Spectroscopy of Trap Levels in Bulk and LPE Hg 1-x CdxTe

December 31, 1993

Author(s)

Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G. Seiler

Heavily Accumulated Surfaces of Mercury Cadmium Telluride Detectors: Theory and Experiment

July 1, 1993

Author(s)

J R. Lowney, David G. Seiler, W. R. Thurber, Z. Yu, X. N. Song, Chris L. Littler