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Search Publications by: Jason Holm (Fed)

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Displaying 1 - 25 of 40

Transmission Electron Imaging and Diffraction of Asbestos Fibers in an SEM

July 24, 2024
Author(s)
Jason Holm, Elisabeth Mansfield
Asbestos, a known carcinogen, can be found in consumer products ranging from building materials to textiles. While most of the products are no longer produced domestically, the release of asbestos fibers from these and other non-anthropogenic sources into

Detailed analysis of the synthesis and structure of MAX phase (Mo0.75V0.25)5AlC4 and its MXene (Mo0.75V0.25)5C4

June 27, 2023
Author(s)
Rose Snyder, Mikkel Juelsholt, Curran Kalha, Jason Holm, Elisabeth Mansfield, Tien-Lin Lee, Pardeep Thakur, Aysha Riaz, Benjamin Moss, Anna Regoutz, Christina Birkel
MAX phases with the general formula Mn+1AXn are layered carbides, nitrides and carbonitrides with varying stacking sequence of layers of M6X octahedra and the A-element depending on n. While "211" MAX phases (n = 1) are very common, MAX phases with higher

Orientation Mapping of Graphene Using 4D STEM-in-SEM

October 13, 2020
Author(s)
Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning transmission electron microscopy in the scanning electron microscope), collects a diffraction

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

May 1, 2019
Author(s)
Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D materials. The method can generate grain orientational maps of monolayer graphene over a field of