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Search Publications by: Jason Holm (Fed)

Displaying 26 - 40 of 40

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

May 1, 2019

Author(s)

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D materials. The method can generate grain orientational maps of monolayer graphene over a field of

A programmable dark-field detector for imaging two-dimensional materials in the scanning electron microscope

February 7, 2019

Author(s)

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

Unit cell orientation information is encoded in electron diffraction patterns of crystalline materials. Traditional transmission electron detectors implemented in the scanning electron microscope are highly symmetric and are insensitive to in-plane unit

Transmission Imaging with a Programmable Detector in a Scanning Electron Microscope

September 13, 2018

Author(s)

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

A new type of angularly selective electron detector for use in a scanning electron microscope is presented. The detector leverages a digital micromirror device (DMD) to take advantage of the benefits of two-dimensional (2D) imaging detectors and high

Using a Modular Aperture System to Obtain Annular Dark-Field Image Intensity Distributions as a Function of Scattering Angle.

June 15, 2018

Author(s)

Jason D. Holm

In this contribution, 10 nm-thick non-stoichiometric silicon nitride films were examined in a scanning electron microscope (SEM) using a zero-dimensional solid-state transmission electron detector equipped with a modular aperture system. Effects of several

Acceptance Angle Control for Improved Transmission Imaging in an SEM

March 1, 2017

Author(s)

Jason D. Holm, Robert R. Keller

This contribution presents a simple, cost-effective modular aperture system enabling comprehensive acceptance angle control for STEM-in-SEM imaging. The system is briefly described, and different ways to use it are explained. To demonstrate the utility of

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

July 25, 2016

Author(s)

Ann C. Chiaramonti Debay, Ryan M. White, Jason D. Holm, Elisabeth Mansfield

Multi-walled carbon nanotubes (MWCNTs) play a significant role in the nascent nanotechnology industry, due to their remarkable combination of mechanical, thermal, and electrical properties. These materials are specialty additives, reinforcing a diverse

Angularly-Selective Transmission Imaging in a Scanning Electron Microscope

May 5, 2016

Author(s)

Jason D. Holm, Robert R. Keller

This contribution presents recent advances in imaging control conditions for transmission scanning electron microscopy (t-SEM) by means of angularly-selective electron collection with a commercial scanning transmission electron microscopy-in-scanning

An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy

September 22, 2015

Author(s)

Taylor J. Woehl, Jason D. Holm, Robert R. Keller

Here we employ an analytical electron scattering model to show that the decrease in ADF t-SEM contrast of gold nanoparticles on carbon films is consistent with a competition between mass-thickness and atomic number contrast. Images of gold nanoparticles on