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Physics

Electron physics

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Displaying 101 - 125 of 348

Antiferromagnetic domain wall motion driven by spin-orbit torques

August 16, 2016
Author(s)
Takayuki Shiino, Se-Hyeok Oh, Paul M. Haney, Seo-Won Lee, Gyungchoon Go, Byong-Guk Park, Kyung-Jin Lee
We theoretically investigate dynamics of antiferromagnetic domain walls driven by spin-orbit torques in antiferromagnet/heavy metal bilayers. We show that spin-orbit torques drive antiferromagnetic domain walls much faster than ferromagnetic domain walls

Interfacial magnetic anisotropy from a 3-dimensional Rashba substrate

July 18, 2016
Author(s)
Junwen Li, Paul M. Haney
We study the magnetic anisotropy which arises at the interface between a thin film ferromagnet and a 3-d Rashba material. The 3-d Rashba material is characterized by the spin-orbit strength $\alpha$ and the direction of broken bulk inversion symmetry $\hat

Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low Energy

June 10, 2016
Author(s)
Jason Campbell, Jason Ryan, Kin P. Cheung, David J. Gundlach, Changze Liu, Canute I. Vaz, Richard G. Southwick III, Anthony S. Oates, Ru Huang
Wave scattering by a potential step is a nearly ubiquitous concept. Thus, it is surprising that theoretical treatments of ballistic transport in nanoscale devices, from quantum point contacts to ballistic transistors, assume no reflection even when the

Electrical Units in the New SI: Saying Goodbye to the 1990 Values

May 12, 2016
Author(s)
Nick Fletcher, Gert Rietveld, James K. Olthoff, Ilya F. Budovsky
The proposed redefinition of several SI base units is a topic that has been on the metrology agenda for the last decade. The general principles and the motivation for the changes have been presented at the NCSLI several times. However, recent progress on

Direct imaging of coexisting ordered and frustrated sublattices in artificial ferromagnetic quasicrystals

April 25, 2016
Author(s)
Barry Farmer, Vinayak Bhat, Andrew L. Balk, Eric Teipel, Nathan Smith, John Unguris, D.J. Keavney, Todd Hastings, L .E. De Long
Quasicrystals are rarely found in nature and are difficult to grow in the laboratory, but exhibit unique physical properties resulting from their signature long-range structural order without periodic translational symmetry. Magnetic interactions in

Optical Spintronics in Organic-Inorganic Perovskites Photovoltaics

April 25, 2016
Author(s)
Junwen Li, Paul M. Haney
Organic-inorganic halide CH 3NH 3PbI 3 solar cells have attracted enormous attention in recent years due to their remarkable power conversion efficiency. These materials should exhibit interesting spin-dependent properties as well, owing to the strong spin

Device-Level Jitter as a Probe of Ultrafast Traps in High-k MOSFETs

April 16, 2016
Author(s)
Dmitry Veksler, Jason Campbell, Kin (Charles) Cheung, J. Zhong, H. Zhu, C. Zhao
A methodology for evaluation of ultra-fast interfacial traps, using jitter measurements as a probe, is developed. This methodology is applied to study the effect of PBTI stress on density of ultra-fast electron traps (with 500ps to 5ns characteristic

Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry

March 22, 2016
Author(s)
John S. Villarrubia, Vipin N. Tondare, Andras Vladar
The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is described

Engineering Near-Field SEIRA Enhancements in Plasmonic Resonators

January 20, 2016
Author(s)
Jungseok Chae, Basudev Lahiri, Andrea Centrone
Engineering of the optical resonances in plasmonic resonators arrays is achieved by virtue of the intrinsic properties to the constituent structures such as composition, size and shape and by controlling the inter-resonator interactions by virtue the array

Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library

July 1, 2015
Author(s)
John S. Villarrubia, Andras Vladar, Bin Ming, Regis J. Kline, Daniel F. Sunday, Jasmeet Chawla, Scott List
The width and shape of 10 nm to 12 nm wide lithographically patterned SiO2 lines were measured in the scanning electron microscope by fitting the measured intensity vs. position to a physics-based model in which the lines’ widths and shapes are parameters