U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Thomas B. Lucatorto (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 76 - 100 of 228

Studies of Intensity Noise at Synchrotron Ultraviolet Radiation Facility III

March 1, 2002
Author(s)
Uwe Arp, Thomas B. Lucatorto, K Harkay, K Kim
Suppression of beam instabilities has become an important goal at synchrotron radiation light sources, where highly sensitive applications like metrology, Fourier--transform spectroscopy and microscopy are now in use. We describe measurements connecting

The New UV Radiometry Facility at SURF

March 1, 2002
Author(s)
Ping-Shine Shaw, Keith R. Lykke, R Gupta, Uwe Arp, Thomas B. Lucatorto, Albert C. Parr
The Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology (NIST) provides a unique opportunity for high-accuracy VUV to visible radiometry with the completion of a recent upgrade to improve the

Upgrades to the NIST/DARPA EUV Reflectometry Facility

December 1, 2001
Author(s)
Charles S. Tarrio, Thomas B. Lucatorto, S Grantham, M B. Squires, Uwe Arp, Lu Deng
We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Facility

Tomography of Integrated Circuit Interconnects

October 1, 2001
Author(s)
Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigration

Elimation of Intensity Noise at SURF III

August 1, 2001
Author(s)
Uwe Arp, K Harkay, K Kim, Thomas B. Lucatorto
Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer installed

Accurate Pattern Registration for Integrated Circuit Tomography

July 1, 2001
Author(s)
Zachary H. Levine, S Grantham, S Neogi, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Thomas B. Lucatorto
As part of an effort to develop high resolution microtomography for engineered structures, a two-level copper integrated circuit interconnect was imaged using 1.83 keV x-rays at 14 angles employing a full-field Fresnel zone plate microscope. A major

Evaluating Optical Materials

May 1, 2001
Author(s)
Charles S. Tarrio, Thomas B. Lucatorto
curately quantifying optical constants is key to fabricating successful multiplayer film components

Spontaneous Coherent Microwave Emission and the Sawtooth Instability in a Compact Storage Ring

May 1, 2001
Author(s)
Uwe Arp, Gerald T. Fraser, Angela R. Hight Walker, Thomas B. Lucatorto, K K. Lehmann, K Harkay, N Sereno, K Kim
Strong evidence for self-excited emission of coherent synchrotron radiation in the microwave spectral region was observed at the Synchrotron Ultraviolet Radiation Facility SURF III electron storage ring at the National Institute of Standards and Technology